The topics which were covered included:
Ion Detection in Helium Ion Microscopy and Atom Probe Tomography
Low and Medium Energy Ion Scattering
Material Science Analysis Using HRDP Methods
New Facilities and Instrumental Developments
Quantitative Analysis of Biological Surfaces and Interfaces
Rutherford Backscattering, Elastic Recoil Detection and Narrow Nuclear Reaction Profiling with Atomic Layer Depth Resolution
Secondary Ion Mass Spectroscopy and Alternative Depth Profiling Methods
Special Topics (RRT, etc.)
Theoretical Developments and New Computer Simulations
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