Schedule

Sunday, August 7

15:00-20:00

Registration, London Hall

18:30-21:00

Welcome Reception, London Hall

Monday, August 8

08:00-

Registration, Physics and Astronomy Atrium

09:00-10:25

Session 1, John O'Connor, Chair

09:00-09:20

Welcoming Remarks, Physics and Astronomy Rm. 148 (all oral presentations)

9:20-10:00

 001

Roth, D., Goebl, D., Bruckner, B., Steinberger, R., Primetzhofer, D., Bauer, P.

Quantitative low energy ion scattering: Achievements and challenges

10:00-10:25

  002

Bruckner, B., Roth, D., Goebl, D., Juaristi, J.I., Alducin, M., Steinberger, R., Primetzhofer, D., Bauer, P.

Electronic stopping of slow protons in transition metals

10:25-11:00

Coffee Break, Physics and Astronomy Atrium (all coffee breaks)

11:00-12:05

Session 2, Giovanni Fanchini, Chair

11:00-11:40

 003

Copel, M.

MEIS of materials for post-silicon electronics

11:40-12:05

 004

van den Berg, J.A., Rossall, A.K., England, J.G., Alencar, I., Marmitt, G.G., Grande, P.L.

12:05-13:30

Lunch, University Community Centre, The Wave, 2nd Floor

13:30-15:00

Session 3, Matt Copel, Chair

13:30-14:10

 005

England, J.G., van den Berg, J.A., Rossall, A.K., Alencar, I., Marmitt, G.G., Trombini, H., Grande, P.L.

Combining Medium Energy Ion Scattering measurements with TRIDYN dynamic modelling to characterise a plasma doping process

14:10-14:35

 006

Avila, T.S., Fichtner, P.R.P., Hentz, A., Grande, P.L.

On the use of MEIS cartography for the determination of Si_1-xGe_x
thin-film strain

14:35-15:00

 007

Alencar, I., Marmitt, G.G., Grande, P.L., England, J.G., Rossall, A.K., van den Berg, J.A.

Compositional depth profile investigation of plasma doped Si/SiO₂:As by Medium-Energy Ion Scattering

15:00-15:30

Coffee Break

15:30-17:00

Session 4, Pedro Grande, Chair

15:30-15:55

 008

Brocklebank, M., Noël, J.J., Goncharova, L.V.

Passive TiO₂ growth studies using Medium Energy Ion Scattering and Nuclear Reaction Profiling

15:55-16:20

 009

Marmitt, G.G., Nandi, S.K., Venkatachalam, D.K., Elliman, R.G., Vos, M., Grande, P.L.

Application of ERBS analysis on O diffusion in TiO₂ films

16:20-17:00

 010

Moon, D.W., Grande, P.L., Marmitt, G.G., RRT participants

International RRT of MEIS analysis of HfO₂ thin films and multiple delta layers

17:00-

Meeting of the International Scientific Committee

Tuesday, August 9

08:45-10:30

Session 5, Torgny Gustafsson, Chair

08:45-09:25

 011

Feldman, L.C., Gustafsson, T., Manichev, V., Wang, H.

He Ion Microscopes: Potential and pitfalls

09:25-10:05

 012

Klingner, N., Heller, R., Hlawacek, G., Gnauck, P., Facsko, S., Borany, J.v.

Ion beam analysis in a Helium Ion Microscope – elemental mapping on the nm scale

10:05-10:30

 013

Manichev, V., Garfunkel, E., Yang, J., Chhowalla, M., Lagos, M., Batson, P., Feldman, L.C., Gustafsson, T.

Helium Ion Microscopy studies of biological/biomedical samples, atomic size defects and elemental identification

10:30-11:00

Coffee Break

11:00-12:05

Session 6, DaeWon Moon, Chair

11:00-11:40

 014

Primetzhofer, D.

Electronic interactions of medium-energy ions with solids: some recent results and their implications for high-resolution depth profiling

11:40-12:05

 015

Noakes, T.C.Q., Mistry, S., Cropper, M.D., Rossall, A.K., van den Berg, J.A.

MEIS studies of oxygen plasma cleaning of copper for fast response time photocathodes used in accelerator applications

12:05-13:30

Lunch, University Community Centre, The Wave, 2nd Floor

13:30-16:00

Session 7, Lyudmila Goncharova, Chair

13:30-14:10

 016

Stedile, F.C., Pitthan, E., Corrêa, S.A., Soares, G.V., Radtke, C.

Nuclear Reaction Profiling unraveling the incorporation of water in SiO₂/SiC structures

14:10-14:35

 017

Larochelle, J.-S., Désilets-Benoit, A., Martel, E., Borduas, G., Roorda, S.

Detection of hydrogen in steel with an N-15 nuclear resonance

14:35-15:00

 018

Green, R.J., Macke, S., Sawatzky, G.A.

Element, valence and orbital depth profiling with resonant x-ray reflectometry

15:00-16:00

Discussion on the future of the International Workshop on High-Resolution Depth Profiling

16:00-17:30

Student Poster Competition
cash prizes provided by a generous donation from Professor Emeritus
Ian Mitchell, Department of Physics and Astronomy

Poster Session/Wine and Cheese Reception, Physics and Astronomy Atrium

Photos from the Poster Session may be found here.

 P-1

Brocklebank, M., Goncharova, L.V., Barchet, D., Kherani, N.P.

Medium energy ion scattering and elastic recoil detection for solar silicon devices

 P-2

Cadogan, C.C., Karner, V.L., Tavares, A., Pywowarzcuk, A., Simpson, P.J., Goncharova, L.V. 

Synthesis and characterisation of silicon nanoclusters in alumina

 P-3

Gaudet, J.M., Simpson, P.J.

Depth profiling of silicon quantum dots formed in ion-implanted thermal oxide thin film

 P-4

Lagutin, A.

Device for the transformation of charged particle beams using glass capillaries

 P-5

Marmitt, G.G., Trombini, H., Sulzbach, M.C., Alencar, I., Grande, P.L.

PowerMEIS: RBS/MEIS simulations using cloud computing

 P-6

Martínez-Flores, C., Trujillo-López, L.N., Serkovic-Loli, L.N., Cabrera-Trujillo, R.

Universal scaling of the electronic stopping cross section for swift heavy projectiles colliding with atoms and molecules

 P-7

Min, W.J., Kim, W.S., Park, K., Jung, K.H., An, S.Y., Kim, J.-s., Kim, S.G., Sim, C.S., Kim, S., Kim, J., Yu, K.-S., Sortica, M.A., Grande, P.L., Moon, D.W.

MEIS-K120 using 100 keV He⁺ and TOF analyzer

 P-8

Rideout, J., Knights, A.P., Simpson, P.J., Mascher, P., England, J.G.

Positron Annihilation Spectroscopy with in situ ion implantation to investigate defects in semiconductors over a wide temperature range

 P-9

Zolnai, Z., Petrik, P., Deák, A., Pothorszky, S., Zámbó, D., Vértesy, G., Nagy, N., Rossall, A.K., van den Berg, J.A.

A three-dimensional analysis of Au-silica core-shell nanoparticles using medium energy ion scattering

 P-10

Sortica, M.A., Grande, P.L., Radtke, C., Almeida, L.G., Debastiani, R., Dias, J.F., Hentz, A.

Structural characterization of CdSe/ZnS quantum dots using Medium Energy Ion Scattering

 P-11

Sulzbach, M.C., Marmitt, G.G., Pereira, L.G., Grande, P.L.

Characterization of resistive memories using micro-beam RBS

 P-12

Trombini, H., Marmitt, G.G., Alencar, I., Hatori, M., Grande, P.L., Dias, J.F., Assmann, W., Toulemonde, M., Trautman, C.

Characterization of ejected CaF₂ by swift heavy ion bombardment using MEIS

 P-13

Trombini, H., Marmitt, G.G., Grande, P.L., Alencar, I., England, J.G.

3D characterization of nanostructures using MEIS

 P-14

Zalm, P.C., Bailey, P., Rossall, A.K., van den Berg, J.A.

Quantitative considerations in medium energy ion scattering analysis of nanolayers

 P-15

Xiao, Q.F., Cui, X.Y., Hu, Y.F., Sham, T.K.

Bulk-sensitive Hard X-ray Photoelectron Spectroscopy facility at Canadian Light Source

Wednesday, August 10

09:00-10:30

Session 8, Jaap van den Berg, Chair

09:00-09:40

 019

Nakajima, K., Nagano, K., Marumo, T., Yamamoto, K., Narumi, K., Saitoh, Y., Hirata, K., Kimura, K.

Transmission SIMS: A novel approach to achieving higher secondary ion yields of intact biomolecules

09:40-10:05

 020

Kim, H.J., Chung, K.W., Moon, D.W.

Investigation of electric double layer at liquid interface with TOF-MEIS

10:05-10:30

 021

Schiettekatte, F.

Multiple scattering and geometry effects on depth profiling of 2D and 3D structures

10:30-11:00

Coffee Break

11:00-12:05

Session 9, Daniel Primetzhofer, Chair

11:00-11:40

 022

Moutanabbir, O.

3-D atom-by-atom dissection of materials

11:40-12:05

 023

Karner, V.L., McFadden, R.M.L., Chatzichristos, A., Fujimoto, D., McKenzie, I., Morris, G.D., Cortie, D.L., Kiefl, R.F., MacFarlane, W.A.

Beta-detected Nuclear Magnetic Resonance (β-NMR): Towards depth resolved NMR

12:05-12:20

Pick up bag lunch, Physics and Astronomy Atrium

12:20-12:00

Excursion to Niagara Falls, Banquet at Canadian Warplane Heritage Museum

Photos from the Excursion may be found here.

Thursday, August 11

09:00-10:30

Session 10, Kenji Kimura, Chair

09:00-09:40

 024

van den Berg, J.A., Rossall, A.K., Bailey, P., Barlow, R.J.

MEIS regained at the IIAA in Huddersfield University

09:40-10:05

 025

Roth, D., Bruckner, B., Mardare, A., McGahan, Ch.L., Dosmailov, M., Juaristi, J.I., Alducin, M., Primetzhofer, D., Haglund, Jr., R.F., Pedarnig, J.D., Bauer, P.

Electronic stopping of slow protons in oxides

10:05-10:30

 026

Vajandar, S.K., Wang, W., Chan, T.K., Tok, E.S., Yeo, Y.C., Osipowicz, T.

Interface strain study of ultra-thin HfO₂ films on Ge and GeSn substrates using HR-RBS

10:30-11:00

Coffee Break

11:00-12:15

Session 11, René Heller, Chair

11:00-11:25

 027

Murdoch, A., Trant, A.G., Gustafson, J., Jones, T.E., Noakes, T.C.Q., Bailey, P., Baddeley, C.J.

A MEIS, STM and RAIRS investigation of the adsorption of CO on
cobalt/palladium bimetallic surfaces

11:25-11:50

 028

Noël, J.J., Tun, Z., Shoesmith, D.W.

Neutron reflectometry as in situ probe of thin film composition and layer structure for investigating corrosion and hydrogen absorption in titanium

11:50-12:15

 029

Simpson. P.J., Rideout, J., Knights, A.P.

Vacancy-impurity interactions in ion-implanted silicon

12:15-

Lunch, University Community Centre, The Wave, 2nd Floor